Quantum-inspired Metrology

Parameter estimation in the context of quantum metrology seeks to extract the maximum information from a quantum state about a specific parameter. Part of the group activity addresses the challenge of resolving incoherent light sources below the diffraction limit, with the key parameter being the distance between two point sources. By utilizing suitable measurement techniques, such as spatial mode demultiplexing, one can overcome the Rayleigh limit and achieve superresolution, opening up new possibilities for surpassing the resolution constraints of conventional imaging methods.